Lasertec Corporation designs, manufactures, and sells inspection and measurement equipment in Japan, South Korea, Taiwan, other parts of Asia, and the United States. Its semiconductor-related products include actinic EUV patterned mask inspection systems, EUV mask blanks inspection and review systems, mask inspection systems, EUV pellicle inspection systems, EUV mask backside inspection and cleaning systems, and mask edge inspection systems, as well as phase-shift and transmittance measurement systems, SiC and GaN wafer inspection and review systems, wafer edge inspection and measurement systems, and fully automated wafer measurement systems. It also offers FPD photomask inspection systems, pellicle inspection and mounting systems for CLIOS, FPD mask blanks inspection systems, and microscopes such as laser microscopes and confocal scanning laser microscopes. The company was formerly known as NJS Corporation and changed its name to Lasertec Corporation in 1986; it was founded in 1960 and is headquartered in Yokohama, Japan.